XRF or X-ray fluorescence analysis is a nondestructive method of determining the elemental composition of materials. Our handheld XRF analyzer can accurately measure the percent composition of Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Ga, Ge, Zr, Nb, Mo, Ru, Rh, Pd, Ag, In, Sn, Sb Hf, Ta, W, Re, Pt, Au, Pb, Bi, Mg, Al, Si, P, and S elements.

XRF analysis is commonly used in reverse engineering to measure the composition of elements such as the composition of chromium and carbon in stainless steel to match the same type of stainless steel.

As 3D laser scanners measure the surface of an object there may be instances where we cannot measure the thickness of a object with only laser scan data. Subsequently, we offer the additional use of ultrasonic thickness gauges to non-destructively measure the thickness of objects. This thickness measurement can be used in conjunction with 3D laser scan data to create an accurate and comprehensive CAD model.